Get current pricing for Oem, S-806C Wafer Inspection Field Emission Sem. Permits Inspection Of In-process Wafers Of Up To 6 In. In Diameter Without Coating Or Beam Damage. Inspected . Product Category: Lab Equipment, Sub Category: Analytical Instruments:

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Manufacturer: Oem Part number: S-806C Description: Wafer Inspection Field Emission Sem. Permits Inspection Of In-process Wafers Of Up To 6 In. In Diameter Without Coating Or Beam Damage. Inspected . Product Category: Lab Equipment, Sub Category: Analytical Instruments

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Manufacturer: Oem Part number: S-806C Description: Wafer Inspection Field Emission Sem. Permits Inspection Of In-process Wafers Of Up To 6 In. In Diameter Without Coating Or Beam Damage. Inspected . Product Category: Lab Equipment, Sub Category: Analytical Instruments