Get current pricing for Kla/tencor, SURFSCAN 6420 Unpatterned Surface Inspection System. Easily Detects Sub-micron Particles On Rough Surfaces Such As Polysilicon And Tungsten, Yet Provides Sensitivit . Product Category: Semiconductor, Sub Category: Lab Equipment:

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Manufacturer: Kla/tencor Part number: SURFSCAN 6420 Description: Unpatterned Surface Inspection System. Easily Detects Sub-micron Particles On Rough Surfaces Such As Polysilicon And Tungsten, Yet Provides Sensitivit . Product Category: Semiconductor, Sub Category: Lab Equipment

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Manufacturer: Kla/tencor Part number: SURFSCAN 6420 Description: Unpatterned Surface Inspection System. Easily Detects Sub-micron Particles On Rough Surfaces Such As Polysilicon And Tungsten, Yet Provides Sensitivit . Product Category: Semiconductor, Sub Category: Lab Equipment