Get current pricing for Four Dimensions, 280C Four Point Probe Resistivity Mapping System. Recipe Driven Automatic Operation. Manual Or Auto Modes. Accommodates Wafers Up To 150 Mm. Measurement Ra . Product Category: Semiconductor, Sub Category: Lab Equipment:

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Manufacturer: Four Dimensions Part number: 280C Description: Four Point Probe Resistivity Mapping System. Recipe Driven Automatic Operation. Manual Or Auto Modes. Accommodates Wafers Up To 150 Mm. Measurement Ra . Product Category: Semiconductor, Sub Category: Lab Equipment

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Manufacturer: Four Dimensions Part number: 280C Description: Four Point Probe Resistivity Mapping System. Recipe Driven Automatic Operation. Manual Or Auto Modes. Accommodates Wafers Up To 150 Mm. Measurement Ra . Product Category: Semiconductor, Sub Category: Lab Equipment