Get current pricing for Applied Materials, EXCITE High Speed Particle Detection System For Bare Wafer Or Patterned Wafer Inspection. Inspects Device Wafers After Processing Is Completed Or Inspects Bl . Product Category: Semiconductor, Sub Category::

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Manufacturer: Applied Materials Part number: EXCITE Description: High Speed Particle Detection System For Bare Wafer Or Patterned Wafer Inspection. Inspects Device Wafers After Processing Is Completed Or Inspects Bl . Product Category: Semiconductor, Sub Category:

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Manufacturer: Applied Materials Part number: EXCITE Description: High Speed Particle Detection System For Bare Wafer Or Patterned Wafer Inspection. Inspects Device Wafers After Processing Is Completed Or Inspects Bl . Product Category: Semiconductor, Sub Category: