Get current pricing for Kla-tencor, AIT1 High Throughput Scanning Patterned Wafer Defect Inspection System For 100mm-200mm Wafers, Sensitivity 0.10um Latex Spheres On Bare Silicon And Pattern . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

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Manufacturer: Kla-tencor Part number: AIT1 Description: High Throughput Scanning Patterned Wafer Defect Inspection System For 100mm-200mm Wafers, Sensitivity 0.10um Latex Spheres On Bare Silicon And Pattern . Product Category: Semiconductor, Sub Category: Metrology And Inspection

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Manufacturer: Kla-tencor Part number: AIT1 Description: High Throughput Scanning Patterned Wafer Defect Inspection System For 100mm-200mm Wafers, Sensitivity 0.10um Latex Spheres On Bare Silicon And Pattern . Product Category: Semiconductor, Sub Category: Metrology And Inspection