Get current pricing for Nanometrics, 8000 XSE Cassette To Cassette Thin Film Measurement System W/ellipsometer 8 Wafer Stage, Operating System - Ibm Os,j.a. Woolham M44 Ellipsometer, Lps-300 . Product Category: Semiconductor, Sub Category: Metrology And Inspection:

Urgent Requirement - item is needed immediately.

Product Information/Quote Request - needed as soon as possible

Manufacturer: Nanometrics Part number: 8000 XSE Description: Cassette To Cassette Thin Film Measurement System W/ellipsometer 8 Wafer Stage, Operating System - Ibm Os,j.a. Woolham M44 Ellipsometer, Lps-300 . Product Category: Semiconductor, Sub Category: Metrology And Inspection

Quantity Required:

Desired Condition:

New Refurbished Either

Your Name:

Email Address:

Confirm Email Address:

Question/Comment:

please submit once - request may take a few seconds

Quote & Product Information

Manufacturer: Nanometrics Part number: 8000 XSE Description: Cassette To Cassette Thin Film Measurement System W/ellipsometer 8 Wafer Stage, Operating System - Ibm Os,j.a. Woolham M44 Ellipsometer, Lps-300 . Product Category: Semiconductor, Sub Category: Metrology And Inspection