Get current pricing for Nanometrics, 010-0181 Computerized Film Thickness Measurement System. Microspectrophotometer Head Can Measure In The Wavelength Range Of 480 To 790nm. Standard Films Measur . Product Category: Semiconductor, Sub Category::

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Manufacturer: Nanometrics Part number: 010-0181 Description: Computerized Film Thickness Measurement System. Microspectrophotometer Head Can Measure In The Wavelength Range Of 480 To 790nm. Standard Films Measur . Product Category: Semiconductor, Sub Category:

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Manufacturer: Nanometrics Part number: 010-0181 Description: Computerized Film Thickness Measurement System. Microspectrophotometer Head Can Measure In The Wavelength Range Of 480 To 790nm. Standard Films Measur . Product Category: Semiconductor, Sub Category: